You are not logged in!
Do you want to login? It's free!
Who do you implu? Create a Free Account!
- Patents > 2008-07-03 > SECTION G PHYSICS > COMPUTING; CALCULATING; COUNTING > ELECTRIC DIGITAL DATA PROCESSING
METHODS AND SYSTEMS FOR CONTROLLING A SEMICONDUCTOR FABRICATION PROCESS
Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
Filed on: 2007-10-23; Application Number: 11877264