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Sun, 19 May 2013.
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Patent Applications

Pub DatePub NumberApp NumberApp DateTitle
2007-09-1320070210785116923912007-03-28STUD SENSING DEVICE
2007-09-1320070210786117480532007-05-14Communicating with an Implanted Wireless Sensor
2007-09-1320070210787105998432005-03-29Current Measurement Apparatus
2007-09-1320070210789116542142007-01-17Automated disk clamping method for spinstand for testing magnetic heads and disks
2007-09-1320070210790105751822004-10-08System And Method For Characterizing A Sample By Low-Frequency Spectra
2007-09-1320070210791116849482007-03-12BRIDGE CIRCUITED MAGNETIC SENSOR HAVING MAGNETO-RESISTIVE ELEMENT AND FIXED RESISTOR WITH THE SAME LAYER CONFIGURATION
2007-09-1320070210792117043662007-02-09Magnetic sensor and manufacturing method therefor
2007-09-1320070210802113719392006-03-10Electronic device, testing apparatus, and testing method
2007-09-1320070210803117099422007-02-22Circuit with an arrangement for the detection of an interrupted connecting line
2007-09-1320070210804117144482007-03-06Load abnormality detecting system and method
2007-09-1320070210805117137202007-03-05Insulation detecting method and insulation detecting device
2007-09-1320070210806113311582006-03-09Fuel cell electric power sensing methodology and the applications thereof
2007-09-1320070210807117036392007-02-08Capacitive humidity sensor
2007-09-1320070210808115449202006-10-10Real-time multi-point ground resistance monitoring device
2007-09-1320070210809105933072005-03-09Joint Fault Detection
2007-09-1320070210810116454302006-12-26V/I source and test system incorporating the same
2007-09-1320070210811113717572006-03-08Apparatus and method for testing semiconductor devices
2007-09-1320070210812114645712006-08-15HIGH-DENSITY PROBE ARRAY
2007-09-1320070210813116279002007-01-26PROBE FOR ELECTRICAL TEST AND PROBE ASSEMBLY
2007-09-1320070210814116833412007-03-07APPARATUS AND METHOD FOR MEASUREMENT OF HARDENABLE MATERIAL CHARACTERISTICS
2007-09-1320070210815117113192007-02-26Blade probe and blade probe card
2007-09-1320070210816117529422007-05-24MP3 MICRO PROBE
2007-09-1320070210817115219122006-09-15Partitioned multi-die wafer-sort probe card and methods of using same
2007-09-1320070210818113713822006-03-09Temperature monitoring and control apparatus and method
2007-09-1320070210819117472022007-05-10FUNCTIONAL AND STRESS TESTING OF LGA DEVICES
2007-09-1320070210820113706312006-03-08Method and apparatus for dissipating heat from an integrated circuit
2007-09-1320070210821117154382007-03-08Display filter and display apparatus including the same
2007-09-1320070210822117490042007-05-15WIRELESS TEST SYSTEM
2007-09-1320070210823117102372007-02-23Measurement apparatus and measurement method
2007-09-1320070210824117154392007-03-08Method of inspecting quiescent power supply current in semiconductor integrated circuit and device for executing the method
2007-09-1320070211646117317322007-03-30Integrated self-optimizing multi-parameter and multi-variable point to multipoint communication system
2007-09-1320070212201116832792007-03-07DEVICE AND METHOD FOR TESTING ELECTRONIC COMPONENTS
2007-09-1320070214397118006202007-05-07Method for testing non-deterministic device data
2007-09-1320070214398113696482006-03-07Electronic device testing system

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